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Material removal mechanism in ultrasonic vibration assisted polishing of micro cylindrical surface on SiC

机译:SiC上微圆柱表面的超声振动辅助抛光中的材料去除机理

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摘要

In consideration of the high hardness of the mold insert material SiC, ultrasonic vibration was introduced in the abrasive polishing (AP) of the linear micro cylindrical surface aiming to enhance the surface quality while improving the machining efficiency. However, the interaction behavior in between the material and polishing tool under ultrasonic vibration has not been studied so far. In this paper, the material removal mechanism of ultrasonic vibration assisted polishing (UVAP) on micro cylindrical SiC surface was investigated to fulfill a fundamental understanding of this process in comparison to the conventional polishing without employing ultrasonic vibration. The collection method of high frequency friction forces was firstly proposed to analyze the friction behavior on the SiC cylindrical surface. Then the relationship between ultrasonic vibration, friction force and micro cylindrical surface quality was studied respectively. The experimental results indicated that when the ultrasonic vibration was applied, the friction force decreased accordingly corresponding to a better surface quality. In addition, the lubrication condition was discussed in UVAP process based on the establishment of the stribeck curve. Furthermore, the wear coefficients were calculated through measuring the material removal depth, the surface morphologies were measured by a scanning electron microscopy in revealing the different material removal modes under various different polishing parameters. Through computation and analysis, it shows that the lower polishing force and relative lower speed as well as the higher vibration frequency and amplitude could result in a lower surface roughness and less polishing marks of micro cylindrical surface on SiC. Finally, the cylindrical arrays were successfully polished with the optimized parameters on precision diamond ground SiC surfaces. (C) 2016 Elsevier Ltd. All rights reserved.
机译:考虑到模具嵌件材料SiC的高硬度,在线性微圆柱表面的研磨抛光(AP)中引入了超声波振动,目的是在提高表面质量的同时提高加工效率。然而,到目前为止,还没有研究材料和抛光工具在超声振动下的相互作用。在本文中,研究了超声振动辅助抛光(UVAP)在微圆柱SiC表面上的材料去除机理,与不使用超声振动的常规抛光相比,该方法对本工艺具有基本的了解。首先提出了高频摩擦力的采集方法,以分析SiC圆柱表面的摩擦行为。然后分别研究了超声振动,摩擦力和微圆柱表面质量之间的关系。实验结果表明,施加超声振动后,摩擦力相应降低,表面质量更好。另外,在建立stribeck曲线的基础上,讨论了UVAP工艺中的润滑条件。此外,通过测量材料去除深度来计算磨损系数,通过扫描电子显微镜测量表面形态以揭示在各种不同抛光参数下的不同材料去除模式。通过计算和分析表明,较低的抛光力和相对较低的速度以及较高的振动频率和振幅可能会导致较低的表面粗糙度和在SiC上的微圆柱表面的较少的抛光痕迹。最终,在精密金刚石磨削的SiC表面上以优化的参数成功抛光了圆柱阵列。 (C)2016 Elsevier Ltd.保留所有权利。

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