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Device Simulation Demands of Upcoming Microelectronics Devices

机译:即将到来的微电子器件的器件仿真需求

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摘要

An overview of models for the simulation of current transport in micro- and nanoelectronic devices within the framework of TCAD applications is presented. Starting from macroscopic transport models, currently discussed enhancements are specifically addressed. This comprises the inclusion of higher-order moments into the transport models, the incorporation of quantum correction and tunneling models up to dedicated quantum-mechanical simulators, and mixed approaches which are able to account for both, quantum interference and scattering. Specific TCAD requirements are discussed from an engineer's perspective and an outlook on future research directions is given.
机译:本文概述了在TCAD应用程序框架内模拟微纳电子器件中电流传输的模型的概述。从宏观运输模型开始,专门讨论了当前讨论的增强功能。这包括将高阶矩包含到传输模型中,将量子校正和隧穿模型合并到专用的量子力学模拟器中,以及能够同时考虑量子干扰和散射的混合方法。从工程师的角度讨论了特定的TCAD要求,并对未来的研究方向进行了展望。

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