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The Hu-Washizu variational principle for the identification of imperfections in beams

机译:Hu-Washizu变分原理用于识别光束中的缺陷

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摘要

This paper presents a procedure for the identification of imperfections of structural parameters based on displacement measurements by static tests. The proposed procedure is based on the well-known Hu-Washizu variational principle, suitably modified to account for the response measurements, which is able to provide closed-form solutions to some inverse problems for the identification of structural parameter imperfections in beams. Copyright (C) 2008 John Wiley & Sons, Ltd.
机译:本文提出了一种基于静态测试的位移测量来识别结构参数缺陷的程序。所提出的过程基于众所周知的Hu-Washizu变分原理,经过适当修改以解决响应测量问题,该过程能够为某些反问题提供封闭形式的解决方案,以识别梁中的结构参数缺陷。版权所有(C)2008 John Wiley&Sons,Ltd.

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