Deflection of Ultrahigh Energy Particle Beams by Repeated Reflections in Bent Monocrystals

摘要

Bent silicon monocrystals are used today in the planar channeling mode for beam extraction and collimation at large accelerators. Volume reflection is more efficient than channeling, though it has a small deflection angle. A device for repeated deflection of a proton beam using a few bent silicon strips in the reflection mode is described in this paper. Sequential silicon strips on the surface of a thick plate are bent by internal stresses in the crystal material resulting from the Twyman effect. As shown by the Monte Carlo calculations, this method for deflecting the beam is optimal for the teraelectronvolt energy range.