A technique for the mass testing of single-sided microstrip detectors

摘要

In 1986-2000, the Skobel'tsyn Institute of Nuclear Physics of Moscow State University took part in the development of a tracker for the D0 experiment (FERMILAB, USA) on the basis of microstrip silicon detectors. Using the mass testing of detectors for this experiment as an example, we describe a technique for testing single-sided microstrip detectors. The experimental results are presented for the detectors produced in Russia during 1998-2000.