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Electron Processes in a Liquid-Xenon Ionization Chamber under Conditions of High-Intensity Pulsed Irradiation

机译:高强度脉冲辐照条件下液氙电离室中的电子过程

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The results of experimental investigation and simulation of electron processes in a liquid-xenon-filled ionization chamber, which is irradiated with bremsstrahlung-radiation pulses from a synchrotron, are presented. The radiation dose was varied from 10{sup}(-6) to 0.11 Gy/pulse. The response of the chamber to an intense pulsed excitation and the recovery of its serviceability after intense irradiation were studied. It has been shown that, at doses >10{sup}(-4) Gy/pulse, the space charge produced in the chamber has a noticeable effect on the formation of electron-conductivity pulses. The shape of the current pulse in the chamber, inside which a space charge is produced, is studied, the pulse parameters are measured, and a model is proposed with allowance for the effect of the space charge. It has been shown that, at doses exceeding the critical values, the space charge disappears within ~50-100 μs, the durations of the transient processes in the electric circuits being as long as ~500 μs. Hence, the spectrometric characteristics of the ionization chamber are restored ≤1 ms after the irradiation terminates.
机译:给出了充液氙气电离室中电子过程的实验研究和模拟结果,该室被来自同步加速器的致辐射辐射脉冲照射。辐射剂量从10 {sup}(-6)变化到0.11 Gy /脉冲。研究了腔室对强脉冲激发的响应以及在强辐射后其使用寿命的恢复。已经表明,在> 10 {sup}(-4)Gy /脉冲的剂量下,腔室内产生的空间电荷对电子电导率脉冲的形成具有显着影响。研究了在腔室内产生空间电荷的电流脉冲的形状,测量了脉冲参数,并提出了考虑空间电荷影响的模型。已经表明,在超过临界值的剂量下,空间电荷在〜50-100μs内消失,电路中瞬态过程的持续时间长达〜500μs。因此,辐照终止后,电离室的光谱特性恢复≤1ms。

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