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首页> 外文期刊>Integrated Ferroelectrics >Influence of Deposition Temperature and N_2 Flow Rate on High Quality ZnO Thin Film Deposited on SiO_2/Si Substrate by Ultrasonic Spray Pyrolysis
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Influence of Deposition Temperature and N_2 Flow Rate on High Quality ZnO Thin Film Deposited on SiO_2/Si Substrate by Ultrasonic Spray Pyrolysis

机译:沉积温度和N_2流速对超声喷涂热解沉积在SiO_2 / Si衬底上高质量ZnO薄膜的影响

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摘要

ZnO thin films were prepared on SiO_2/Si substrate by ultrasonic spray pyrolysis (USP) method using the aqueous solution of zinc acetate dehydrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were employed to analyze the crystalline and microscopic structure of the films. The properties of ZnO films were investigated with respect to deposition temperature (T_s) and N_2 flow rate (f). The results show that ZnO thin films exhibit hexagonal wurtzite structure and the highly preferential orientation along c-axis under T_s = 320 deg C and f = 5 L/min deposition condition.
机译:采用无水醋酸锌水溶液,通过超声喷雾热解(USP)法在SiO_2 / Si衬底上制备ZnO薄膜。 X射线衍射(XRD)和原子力显微镜(AFM)被用来分析薄膜的晶体和微观结构。研究了ZnO薄膜的沉积温度(T_s)和N_2流速(f)的特性。结果表明,在T_s = 320℃和f = 5 L / min的沉积条件下,ZnO薄膜呈现六方纤锌矿结构,并沿c轴具有高度优先的取向。

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