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Ferroelectric Properties of Pb(Zr_(1-x),Ti_x)O_3 Prepared by Modified Metallo-Organic-Decomposition Process

机译:改性金属有机分解法制备Pb(Zr_(1-x),Ti_x)O_3的铁电性能

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摘要

Beneficial effect of nano-sized PZT powder incorporation on modifying the characteristics of Pb(Zr_(1-x),Ti_x)O_3, PZT films was demonstrated. The amorphous phase derived from metallo-organic-decomposition (MOD) process started to crystallize at a post-annealing temperature as low as 500 deg C and can withstand 650 deg C post-annealing temperature process without inducing the PbO-loss phenomenon. However, 500 deg C post-annealed PZT films still exhibit paraelectric properties, which can be ascribed to the co-existence of large proportion of amorphous phase, surrounding the crystalline phase. It needs at least 650 deg C post-annealing process to fully developed the pervoskite structure for PZT films. The remnant polarization (Pr) of the PZT films increases with the proportion of crystalline phase, achieving Pr = 24.9 (mu)C/cm~2 for 650 deg C annealed films, with coercive field (Hc) around Ec = 373 kV/cm.
机译:证明了掺入纳米级PZT粉末对修饰Pb(Zr_(1-x),Ti_x)O_3,PZT薄膜特性的有益作用。源自金属有机分解(MOD)过程的非晶态相在低至500℃的退火后温度下开始结晶,并且可以承受650℃的退火后温度过程而不会引起PbO损耗现象。然而,500℃退火后的PZT薄膜仍表现出顺电特性,这可以归因于围绕结晶相的大部分非晶相的共存。要完全开发出PZT膜的透钙磷石结构,至少需要650℃的后退火工艺。 PZT膜的剩余极化率(Pr)随晶相的比例而增加,对于650℃退火的膜,Pr = 24.9(μ)C / cm〜2,矫顽场(Hc)约为Ec = 373 kV / cm 。

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