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Review of Feature Detection Techniques for Simultaneous Localization and Mapping and System on Chip Approach

机译:同步定位与地图绘制特征检测技术及片上系统方法综述

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摘要

In Vision Simultaneous Localization and Mapping (VSLAM), feature detection is used in landmark extraction and data association. It examines each pixel to find interesting part of an image that would differentiate the landmark and the less important image details. There are numerous studies in this field but they are scattered in many journals and proceedings which would require many hours just to find related material. Therefore, this research has grouped important studies done in this field to be analyzed by future researcher. Feature detection techniques such as Harris, Scale Invariant Feature Transform (SIFT), Speeded-Up Robust Features (SURF), Features from Accelerated Segment Test (FAST) and etc. is discussed in this study. A background history of each technique, their evolution and performance comparison is presented.
机译:在视觉同时定位和制图(VSLAM)中,特征检测用于地标提取和数据关联中。它检查每个像素以找到图像的有趣部分,以区分界标和次要图像细节。该领域有许多研究,但是它们分散在许多期刊和论文集中,要查找相关材料将需要很多小时。因此,本研究将在该领域进行的重要研究归类,以供将来的研究人员进行分析。在这项研究中讨论了诸如哈里斯(Harris),尺度不变特征变换(SIFT),加速鲁棒特征(SURF),加速段测试(FAST)的特征等特征检测技术。介绍了每种技术的背景历史,其发展和性能比较。

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