Infrared thermography applied for high-level current density identification over planar microwave circuit sectors

摘要

This work presents a new method for indirect identification of sectors with high current density concentration in planar microwaves devices. The method consists in the use of infrared thermography (IRT) to determine the superficial two-dimensional temperature field of the device. The results agree well with those obtained with the method that makes use of electromagnetic (EM) simulation using commercial software of numerical analysis.