X-ray determination of the particle-size lognormal distribution in nanocrystalline materials

摘要

Analytical expressions relating parameters of a particle-size lognormal distribution law to the broadening components of a Voigt x-ray diffraction profile are derived. Simple methods for x-ray analysis of the particle-size distribution are developed. Results provided by the techniques developed are shown to be in satisfactory agreement with data of experimental methods, in particular, electron microscopy.