The effect of spectral interference on the actual detection limit in atomic-absorption analysis

摘要

We present a method for evaluating the actual detection limit c{sub}(L.R) in atomic-emission analysis under the conditions of spectral interference represented as the sum of two components: c{sub}(L.O)—the detection limit in a "pure" matrix free of interfering elements, and c{sub}(L.I)—the contribution due to extraneous lines overlapping with the analytical line. Values of c{sub}(L.I) are measured for 20 lines of rare-earth elements in the analysis of natural material of different chemical composition using an argon arc double-jet plasmatron.