Application of molecular markers for incorporation of resistance to rusts and Karnal bunt in wheat.

摘要

This paper discusses the application of molecular markers (restriction fragment length polymorphisms, polymerase chain reaction, random amplified polymorphic DNA, microsatellites or simple sequence repeats, amplified fragment length polymorphism) in wheat breeding for resistance to leaf, stripe and stem rusts (caused by Puccinia triticina [ P. recondita], P. striiformis and Puccinia graminis, respectively), Karnal bunt (caused by Tilletia indica) and other diseases. The wheat production constraints and economic losses due to rust epidemics, as well as the different rust pathotypes, are described.