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首页> 外文期刊>Indian Journal of Pure & Applied Physics >Growth and characterization of copper, indium and copper-indium alloy films non-aqueous method of electrodeposition
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Growth and characterization of copper, indium and copper-indium alloy films non-aqueous method of electrodeposition

机译:非水电沉积铜,铟和铜铟合金膜的生长与表征

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摘要

A new non-aqueous method for electrodeposition of copper, indium and copper indium alloy films, ethylene glycol has been used as the solvent which is non-toxic and non-hazard bath. All the source materials are readily soluble in this bath and they have higher working temperature (>= 160 degrees C). The copper films prepared in ethylene glycol based bath are preferred (111) oriented with grains well connected to each other indicates the epitaxial growth. The indium film has been observed in semi-molten state with intense (101) reflection. The Cu-In alloy film prepares at -1.1 V (Pt) is copper rich but the ratio tends to be 1.0 in the bulk of the film. Multiphase deposits are observed with grains which are spherical and well connected to each other. The resistivity and carrier concentration of the as-deposited copper and copper indium alloy films are found to be 0.2 Omega-cm, 9.9x10(15) per cm(3) and 2.5 Omega-cm and 5.5 x 10(17) per cm(3), respectively. The as-deposited films are found to be resistive but the resistance decreases when the films are annealed at moderate temperature.
机译:电沉积铜,铟和铜铟合金膜的一种新的非水方法,乙二醇已被用作无毒无害镀液的溶剂。所有的原料都易于溶解在该浴中,并且它们具有较高的工作温度(> = 160摄氏度)。优选在基于乙二醇的浴中制备的铜膜(111)取向为具有彼此良好连接的晶粒,表明外延生长。已经观察到铟膜处于半熔融状态并具有强烈​​的(101)反射。在-1.1 V(Pt)下制备的Cu-In合金膜富含铜,但在整个膜中该比例趋于1.0。观察到球形和相互连接良好的晶粒的多相沉积。发现所沉积的铜和铜铟合金膜的电阻率和载流子浓度为0.2Ω-cm,9.9 cm10(15)/ cm(3)和2.5Ω-cm和5.5 x 10(17)/ cm( 3)。发现所沉积的膜是电阻性的,但是当将膜在中等温度下退火时电阻降低。

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