Address Sequences for Multiple-Ron March Tests of Random Access Memory

摘要

In the present study the problem of testing modern random access memories using multiple-run inarch tests and ways of increasing their efficiency through the use of different combinations of address sequences is considered. The use of the Hamming distance as a metric which makes it possible to determine a combination of address sequences for achieving a high degree of completeness of the coverage of complex random access memory faults is evaluated. Numerical estimators of this metric together with experimental data that confirm the effectiveness of the metric for the case of twofold march tests are presented.