DETECTION OF SCAR MAKERS LINKED TO RESISTANCE TO ANTHRACNOSE AND COMMON BLIGHT IN WILD X CULTIVATED BEAN COLLECTION

摘要

Anthracnose [Colletotrichum lindemuthianum (Sacc. & Magn)] and common blight [Xanthomonas axonopodis pv.phaseoli (Smith)] are two of the main diseases of common beans (1, 4) due they can reduce grain yields up 95 %. One choice for disease managementconsists on the production of resistant cultivars using new sources of resistance to a broad spectrum of fungal/bacterial populations (4). New sources of resistance for bean breeding can be found in wild germplasm as well as landraces from major agro-ecological regions of Mexico. The identification of disease resistance genes can be fast and reliable discovered using SCAR (Sequence-characterized amplified region) markers previously reported (2, 8). The aim of this work was to detect ten SCAR markers linked to resistance to anthracnose and common blight in one wild x cultivated beans collection of Mexico.