DETECTION OF SCAR MARKERS LINKED TO RESISTANCE TO COMMON BLIGHT AND ANTHRACNOSE IN AYOCOTE BEANS

摘要

Anthracnose [Colletotrichum lindemuthianum (Sacc. y Magn.)] and common blight [Xanthomonas axonopodis pv. phaseoli (Smith)] are two of major diseases of common beans throughout Mexico causing yield losses up 50 % (3). The use of resistant germplasm could be one cheap and appropriate strategy to reduce grain losses, since Mexican farmers not use pesticides for disease management. SCAR markers linked to both diseases have been identified in common bean germplasm, and they are reproducible and specificto identify genetic resistance to diseases (5, 6). Here we detected 10 SCAR markers previously reported in common beans linked to resistance genes to anthracnose and common blight in one collection of 'ayocote' bean {Phaseolus coccineus L.) germplasm from the state of Puebla, Mexico.