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Differential wavelength-scanning heterodyne interferometer for measuring large step height

机译:差分波长扫描外差式干涉仪,用于测量大台阶高度

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摘要

An interferometer based on the differential heterodyne configuration and wavelength-scanning interferometry for measuring large step heights is presented. The proposed interferometer is less sensitive to environmental disturbances than other interferometers and can accurately measure interference phases. A tunable diode laser is utilized to illuminate the interferometer and thus solve the phase ambiguity problem. Counting the interference fringes as the wavelength is scanned through a known change in wavelength directly determines the step height. Three gauge blocks of different lengths, 5, 10, and 50 mm, are individually wrung on a steel plate to simulate large step heights. Comparing the results measured by the proposed interferometer with those by the gauge block interferometer reveals that the accuracy is approximately 100 nm.
机译:提出了一种基于差分外差结构和波长扫描干涉仪的干涉仪,用于测量较大的台阶高度。所提出的干涉仪对环境干扰的敏感性低于其他干涉仪,并且可以准确地测量干涉相位。利用可调二极管激光器来照射干涉仪,从而解决了相位模糊问题。在通过已知的波长变化扫描波长时对干涉条纹进行计数直接确定了台阶高度。将三个长度分别为5、10和50 mm的量规块拧在钢板上,以模拟较大的台阶高度。将所提出的干涉仪测量的结果与量块干涉仪测量的结果进行比较,发现精度约为100 nm。

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