Method for measuring veiling glare in high-performance display devices

摘要

An experimental method for measuring the veiling glare characteristics of display devices is presented. The measured veiling glare ratio (G) is taken to be the luminance in the surrounding bright field divided by the luminance in a dark circle. The method is based on a collimated conic probe that minimizes signal contamination from bright surroundings allowing for measurements of low luminance in a circular dark spot of a test pattern. A correction factor computed with test patterns having opaque spots is introduced. The factor is expressed as a bivariate function of the dark-spot radius and the distance between the probe and the emissive surface. We studied the uncertainty introduced by the method by measuring veiling glare test patterns printed on radiographic film for which the transmission of the dark spots was determined experimentally. Performance characterization measurements show that signal contamination is less than 10~(-4) of the bright field surrounding a dark circle. Our results show that G of a few hundred can be measured with an uncertainty of a few percent, and ratios of approximately 10~(3) can be reported within 10%. Finally, we demonstrate the method by measuring G for a high-performance monochrome cathode-ray tube display.