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首页> 外文期刊>ECS transactions >Formation and Characterization of Silicon-Quantum-Dots/Metal-Silicide-Nanodots Hybrid Stack and Its Application to Floating Gate Functional Devices
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Formation and Characterization of Silicon-Quantum-Dots/Metal-Silicide-Nanodots Hybrid Stack and Its Application to Floating Gate Functional Devices

机译:的形成和特征Silicon-Quantum-Dots / Metal-Silicide-Nanodots混合堆栈和浮栅的应用程序功能的设备

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摘要

Hybrid nanodots (NDs) structures have been designed and fabricated as a noble functional floating gate, in which Si quantum dots (QDs) as charge counting nodes and either Ni- or Pt-silicide NDs as charge storage nodes are stacked with an ultrathin SiO2 interlayer, to satisfy both large memory windows and multi-valued capability. In the sample preparation, spontaneous formation of high-density Si-QDs on ultrathin SiO2 in the early stages of chemical vapor deposition (CVD) using SiH4 and the full- silicidation of pre-grown Si-QDs promoted with remote H2-plasma exposure after metal evaporation were controlled precisely. MOS capacitors and nMOSFETs with a hybrid FG show clear characteristics caused by stable storage of many charges in the deep potential well of each silicide ND and stepwise charge injection to and emission from NDs through discrete energy states in Si-QDs. In addition, a distinct optical response to 1310nm light irradiation was detected in the C-V characteristics, being interpreted in terms of the shift of charge centroid in the hybrid FG stack due to transfer of photoexcited electrons from silicide NDs to the Si-QDs.
机译:混合nanodots (NDs)结构设计和制造作为一个高贵的功能浮置栅极,硅量子点(量子点)计算节点和Ni -或收费Pt-silicide NDs电荷存储节点堆满了一个超薄的二氧化硅层间,满足大内存窗和多值的能力。准备,自发形成的高密度Si-QDs超薄的二氧化硅早期的化学汽相淀积(CVD)使用SiH4和完整的——silicidation与远程H2-plasma pre-grown Si-QDs提升接触金属蒸发后控制精确。混合FG显示清晰的特点造成的稳定存储许多指控的深每个硅化ND和逐步的势阱电荷注入和排放NDs通过在Si-QDs离散能量状态。不同的光学响应1310海里C-V辐照检测特点,被解释的混合FG电荷重心的转变由于电子转移光激的堆栈从硅化NDs Si-QDs。

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