A Method for Source Apportionment of Lead in Fine Particulate Matter Based on Individual Particle Analysis Using a Synchrotron X-ray Fluorescence Microprobe

摘要

A source apportionment method based on individual particle analysis carried out using a synchrotron X-ray fluorescence microprobe was developed for source apportionment of lead in fine particulate matter. Mass contributions of every emission source were obtained by intensity ratios of the characteristic X-ray spectrum of lead in individual airborne particles. The validity of the method was evaluated. The uncertainty of the source apportionment was estimated, which was within 10percent in this work. The method was applied to the apportionment of lead in fine airborne particles of Shanghai, indicating that the method has a finer performance for source apportionment.