A Method for Source Apportionment of Lead in Fine Particulate Matter Based on Individual Particle Analysis Using a Synchrotron X-ray Fluorescence Microprobe

摘要

A source apportionment method based on individual particle analysis carried out using a synchrotron X-ray fluorescence microprobe was developed for source apportionment of lead in fine particulate matter. Mass contributions of every emission source were obtained by intensity ratios of the characteristic X-ray spectrum of lead in individual airborne particles. The validity of the method was evaluated. The uncertainty of the source apportionment was estimated, which was within 10% in this work. The method was applied to the apportionment of lead in fine airborne particles of Shanghai, indicating that the method has a finer performance for source apportionment.