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Asymptotic expansions for currents caused by small interface changes of an electromagnetic inclusion

机译:由电磁夹杂物的微小界面变化引起的电流的渐近扩展

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We consider solutions to the Helmholtz equation in two dimensions. The aim of this article is to advance the development of high-order asymptotic expansions for boundary perturbations of currents caused by small perturbations of the shape of an inhomogeneity with C~2-boundary. The work represents a natural completion of Ammari et al. [H. Ammari, H. Kang, M. Lim, and H. Zribi, Conductivity interface problems. Part I: Small perturbations of an interface, Trans. Am. Math. Soc. 363 (2010), pp. 2901-2922], where the solution for the Helmholtz equation is represented by a system and the proof of our asymptotic expansion is radically different from Ammari et al. (2010). Our derivation is rigorous and is based on the field expansion method. Its proof relies on layer potential techniques. It plays a key role in developing effective algorithms to determine certain properties of the shape of an inhomogeneity based on boundary measurements.
机译:我们在两个方面考虑亥姆霍兹方程的解。本文的目的是为由C〜2边界的不均匀形状的小扰动引起的电流边界扰动发展高阶渐近展开。该工作代表了Ammari等人的自然完成。 [H。 Ammari,H。Kang,M。Lim和H.Zribi,《电导率界面问题》。第一部分:接口的小扰动Trans。上午。数学。 Soc。 363(2010),第2901-2922页],其中Helmholtz方程的解由一个系统表示,而我们的渐近展开的证明与Ammari等人的研究完全不同。 (2010)。我们的推导是严格的,并且基于场扩展方法。它的证明依赖于层潜在技术。它在开发有效的算法以基于边界测量确定不均匀性形状的某些特性方面起着关键作用。

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