Quantitative detection of thermal barrier coating thickness based on simulated annealing algorithm using pulsed infrared thermography technology

摘要

Quantitative detection of thermal barrier coating thickness based on simulated annealing (SA) algorithm has been carried out using pulsed infrared thermography technology. The principle of quantitative detection of thermal barrier coating thickness was given, and the model of inverse heat conduction problem was built. The basic principle and implementation process of SA algorithm was described. The specimen with uneven coating thickness was detected using pulsed infrared thermography system, and the coating thickness was calculated using SA algorithm. Results show that when the coating thickness is 45 similar to 130 mu m, compared with eddy current testing results, the relative error is less than 10%, which proves the effectiveness of the coating thickness detection method proposed in this paper. (C) 2016 Elsevier Ltd. All rights reserved.