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The role of nanoscale defect features in enhancing the thermoelectric performance of p-type nanostructured SiGe alloys

机译:纳米缺陷特征增强的作用p型的热电性能纳米锗硅合金

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摘要

Despite SiGe being one of the most widely studied thermoelectric materials owing to its application in radioisotope thermoelectric generators (RTG), the thermoelectric figure-of merit (ZT) of p-type SiGe is still quite low, resulting in poor device efficiencies. In the present study, we report a substantial enhancement in ZT similar to 1.2 at 900 degrees C for p-type nanostructured Si80Ge20 alloys by creating several types of defect features within the Si80Ge20 nanostructured matrix in a spectrum of nano to meso-scale dimensions during its nanostructuring, by employing mechanical alloying followed by spark plasma sintering. This enhancement in ZT, which is similar to 25% over the existing state-of-the-art value for a p-type nanostructured Si80Ge20 alloy, is primarily due to its ultralow thermal conductivity of similar to 2.04 W m(-1) K-1 at 900 degrees C, resulting from the scattering of low-to-high wavelength heat-carrying phonons by different types of defect features in a range of nano to meso-scale dimensions in the Si80Ge20 nanostructured matrix. These include point defects, dislocations, isolated amorphous regions, nano-scale grain boundaries and more importantly, the nano to meso-scale residual porosity distributed throughout the Si80Ge20 matrix. These nanoscale multi-dimensional defect features have been characterized by employing scanning and transmission electron microscopy and correlated with the electrical and thermal transport properties, based on which the enhancement of ZT has been discussed.
机译:虽然锗硅是最广泛研究的课题之一热电材料由于其应用程序在放射性同位素热电发生器(RTG优先),热电的优点(ZT型)的p型锗硅仍很低,导致可怜的设备效率。大幅增强ZT型类似于1.2对p型纳米Si80Ge20 900摄氏度合金通过创建多种类型的缺陷在Si80Ge20纳米特性矩阵的谱nano数值尺寸在纳米结构,采用机械合金化火花紧随其后等离子烧结。在现有的类似于25%最先进的p型值主要是由于纳米Si80Ge20合金的超低热导率相似2.04 W m (1) k - 1在900摄氏度,导致由低散射的波长由不同类型的载热声子在一系列纳米细观缺陷特征维度的Si80Ge20纳米矩阵。这些包括点缺陷,混乱,孤立的无定形区域,纳米颗粒边界和更重要的是,nano中尺度残余孔隙度分布在整个Si80Ge20矩阵。多维的缺陷特征采用扫描和特点透射电子显微镜和相关的电和热传输ZT型的属性,在此基础上增强已经进行了讨论。

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