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Controlling the ripple density and heights: a new way to improve the electrical performance of CVD-grown graphene

机译:控制波纹密度和高度:一个新的改善的电气性能的方法CVD-grown石墨烯

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We report a new way to enhance the electrical performances of large area CVD-grown graphene through controlling the ripple density and heights after transfer onto SiO2/Si substrates by employing different cooling rates during fabrication. We find that graphene films prepared with a high cooling rate have reduced ripple density and heights and improved electrical characteristics such as higher electron/hole mobilities as well as reduced sheet resistance. The corresponding Raman analysis also shows a significant decrease of the defects when a higher cooling rate is employed. We suggest a model that explains the improved morphology of the graphene film obtained with higher cooling rates. From these points of view, we can suggest a new pathway toward a relatively lower density and heights of ripples in order to reduce the flexural phonon-electron scattering effect, leading to higher lateral carrier mobilities.
机译:我们报告一个提高电气的新方法大面积CVD-grown石墨烯的性能通过控制波纹密度和山庄后转移到二氧化硅/硅基板上采用不同的冷却率制造。高的冷却速率减少了涟漪密度和高度和改善电更高的电子/孔等特征的机动性以及降低薄层电阻。对应的拉曼分析还显示了当一个更高的显著下降的缺陷采用冷却速率。解释了改善石墨烯的形貌电影获得更高的冷却速率。这些观点,我们可以建议一个新的途径向密度和相对较低山庄的涟漪,以减少弯曲phonon-electron散射效应,导致更高的横向载体的机动性。

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