...
首页> 外文期刊>Applied optics >Three-dimensional evaluation of subsurface damage in optical glasses with ground and polished surfaces using FF-OCT
【24h】

Three-dimensional evaluation of subsurface damage in optical glasses with ground and polished surfaces using FF-OCT

机译:使用FF-OCT与地面和抛光表面的光学眼镜造成的三维评估

获取原文
获取原文并翻译 | 示例

摘要

Subsurface damage (SSD) induced during conventional manufacturing of optics contributes mainly to a reduction in the performance and quality of optics. In this paper, we propose the application of full-field optical coherence tomography (FF-OCT) as a high-resolution and nondestructive method for evaluation ofSSDin optical substrates. Both ground and polished surfaces can be successfully imaged, providing a path to control SSD throughout the entire optics manufacturing process chain. Full tomograms are acquired for qualitative and quantitative analyses of both surface and SSD. The main requirements for the detection of SSD are addressed. Data processing allows the removal of low-intensity image errors and the automatic evaluation of SSD depths. OCT scans are carried out on destructively referenced glass samples and compared to existing predictive models, validating the obtained results. Finally, intensity projection methods and depth maps are applied to characterize crack morphologies. The experiments highlight differences in crack characteristics between optical glasses SF6 and HPFS7980 and illustrate thatwet etching can enhance three-dimensional imaging ofSSDwith FF-OCT. (C) 2021 Optical Society of America
机译:光学器件常规制造过程中产生的亚表面损伤(SSD)主要导致光学器件性能和质量的降低。在本文中,我们提出应用全场光学相干层析成像(FF-OCT)作为一种高分辨率和非破坏性的方法来评估光学基板中的SSD。研磨和抛光表面都可以成功成像,为整个光学制造过程链中的SSD控制提供了一条途径。获取完整的断层图像,用于表面和SSD的定性和定量分析。介绍了SSD检测的主要要求。数据处理可以消除低强度图像错误,并自动评估SSD深度。对破坏性参考玻璃样品进行OCT扫描,并与现有预测模型进行比较,验证所得结果。最后,采用强度投影法和深度图对裂纹形貌进行表征。实验突出了光学玻璃SF6和HPFS7980之间的裂纹特性差异,并说明湿法刻蚀可以增强美国FF- OCT(C)2021光学学会SSD的三维成像。

著录项

  • 来源
    《Applied optics》 |2021年第8期|共9页
  • 作者单位

    EAH Jena Univ Appl Sci Dept SciTec Carl Zeiss Promenade 2 D-07745 Jena Germany;

    EAH Jena Univ Appl Sci Dept SciTec Carl Zeiss Promenade 2 D-07745 Jena Germany;

    EAH Jena Univ Appl Sci Dept SciTec Carl Zeiss Promenade 2 D-07745 Jena Germany;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用;
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号