首页> 外国专利> 3 3 3 3 THREE-DIMENSIONAL SURFACE ROUGHNESS EVALUATING DEVICE THREE-DIMENSIONAL SURFACE ROUGHNESS EVALUATING METHOD THREE-DIMENSIONAL SURFACE ROUGHNESS DATA ACQUIRING DEVICE AND THREE-DIMENSIONAL SURFACE ROUGHNESS DATA ACQUIRING METHOD

3 3 3 3 THREE-DIMENSIONAL SURFACE ROUGHNESS EVALUATING DEVICE THREE-DIMENSIONAL SURFACE ROUGHNESS EVALUATING METHOD THREE-DIMENSIONAL SURFACE ROUGHNESS DATA ACQUIRING DEVICE AND THREE-DIMENSIONAL SURFACE ROUGHNESS DATA ACQUIRING METHOD

机译:3 3 3 3三维表面粗糙度评估设备三维表面粗糙度评估方法三维表面粗糙度数据获取装置和三维表面粗糙度数据获取方法

摘要

The present invention has been obtained by a two-dimensional laser displacement meter, a moving mechanism for moving the two-dimensional laser displacement meter in the X-axis direction, a moving distance measuring device for measuring the moving distance in the X-axis direction of the two-dimensional laser displacement meter, and a two-dimensional laser displacement meter. A three-dimensional surface roughness evaluation apparatus having a computing device for generating three-dimensional surface roughness data of a measurement object based on the displacement data and the moving distance data acquired by the moving distance measuring device, wherein the two-dimensional laser displacement meter has a predetermined interval. The width direction of the two-dimensional laser displacement meter is arranged to coincide with the Y-axis direction so that the displacement data of the Y-axis coordinate can be measured every time, and the measurement width of the two-dimensional laser displacement meter is at least twice the average length RSm of the element to be measured. As described above, the computing device averages the displacement data acquired at regular intervals in the X-axis direction by the two-dimensional laser displacement meter in the Y-axis direction and The reference plane data of the coordinates is generated, and the reference plane data of each coordinate is subtracted from the displacement data of each X-Y plane coordinate, thereby generating three-dimensional surface roughness data of the measurement target.
机译:本发明是通过二维激光位移计,用于使二维激光位移计在X轴方向上移动的移动机构,用于测量X轴方向上的移动距离的移动距离测量装置而获得的。二维激光位移计和二维激光位移计。一种三维表面粗糙度评估装置,其具有计算装置,该计算装置用于基于由移动距离测量装置获取的位移数据和移动距离数据来生成测量对象的三维表面粗糙度数据,其中,二维激光位移计具有预定间隔。二维激光位移计的宽度方向被布置成与Y轴方向一致,从而可以每次测量Y轴坐标的位移数据,并且二维激光位移计的测量宽度至少是被测元素平均长度RSm的两倍。如上所述,计算装置对二维激光位移计在Y轴方向上以规则的间隔在X轴方向上获取的位移数据进行平均,并且生成坐标的参考平面数据,并且将参考平面从每个XY平面坐标的位移数据中减去每个坐标的数据,从而生成测量目标的三维表面粗糙度数据。

著录项

  • 公开/公告号KR102073803B1

    专利类型

  • 公开/公告日2020-02-05

    原文格式PDF

  • 申请/专利权人 주고꾸 도료 가부시키가이샤;

    申请/专利号KR20197004507

  • 发明设计人 미에노 히로히사;

    申请日2017-07-24

  • 分类号G01B11/30;G01B11;G01B11/02;G01D1/02;G01D5/347;G01J1/02;

  • 国家 KR

  • 入库时间 2022-08-21 11:05:24

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