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Comparison of different characterization methods for nanoparticle dispersions before and after aerosolization

机译:雾化前后纳米颗粒分散体不同表征方法的比较

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A well-known and accepted aerosol measurement technique, the scanning mobility particle sizer (SMPS), is applied to characterize colloidally dispersed nanoparticles. To achieve a transfer from dispersed particles to aerosolized particles, a newly developed nebulizer (N) is used that, unlike commonly used atomizers, produces significantly smaller droplets and therefore reduces the problem of the formation of residual particles. The capabilities of this new instrument combination (N + SMPS) for the analysis of dispersions were investigated, using three different dispersions, i.e. gold-PVP nanoparticles (~20 nm), silver-PVP nanoparticles (~70 nm) and their 1:1 (m : m) mixture. The results are compared to scanning electron microscopy (SEM) measurements and two frequently applied techniques for characterizing colloidal systems: Dynamic light scattering (DLS) and analytical disc centrifugation (ADC). The differences, advantages and disadvantages of each method are discussed, especially with respect to the size resolution of the techniques and their ability to distinguish the particle sizes of the mixed dispersion. While DLS is, as expected, unable to resolve the binary dispersion, SEM, ADC and SMPS are able to give quantitative information on the two particle sizes. However, while the high-resolving ADC is limited due to the dependency on a predefined density of the investigated system, the transfer of dispersed particles into an aerosol and subsequent analysis with SMPS are an adequate way to characterize binary systems, independent of the density of concerned particles, but matching the high resolution of the ADC. We show that it is possible to use the well-established aerosol measurement technique (N + SMPS) in colloid science with all its advantages concerning size resolution and accuracy.
机译:扫描迁移率粒度仪(SMPS)是一种众所周知的公认气溶胶测量技术,用于表征胶体分散的纳米颗粒。为了实现从分散颗粒到雾化颗粒的转移,使用了新开发的雾化器(N),与常用的雾化器不同,该雾化器产生的液滴明显更小,因此减少了残留颗粒形成的问题。使用三种不同的分散体,即金-PVP纳米颗粒(〜20 nm),银-PVP纳米颗粒(〜70 nm)及其1:1,研究了这种新型仪器组合(N + SMPS)分析分散体的能力。 (m:m)混合物。将结果与扫描电子显微镜(SEM)测量和两种用于表征胶体系统的常用技术进行比较:动态光散射(DLS)和分析盘离心(ADC)。讨论了每种方法的区别,优点和缺点,特别是关于技术的尺寸分辨率及其区分混合分散体粒径的能力。正如预期的那样,DLS无法解决二元色散,而SEM,ADC和SMPS能够提供有关两种粒径的定量信息。但是,尽管高分辨率ADC由于依赖于所研究系统的预定密度而受到限制,但将分散的颗粒转移到气溶胶中以及随后使用SMPS进行分析是表征二元系统的适当方法,而与密度无关。有关的粒子,但与ADC的高分辨率匹配。我们表明,有可能在胶体科学中使用成熟的气溶胶测量技术(N + SMPS),其有关尺寸分辨率和精度的所有优势。

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