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Atomic Force Microscope: A Tool for Studying Ionophores

机译:原子力显微镜:研究离子载体的工具

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The aim of the investigations was to show the analytical use of an atomic force microscopy (AFM) tip coated with an ion-selective membrane and to show that the ion-selective boundaiy potential is detectable as a force induced by ion-selective electrostatic interactions, which are i*ore pronounced than double-layer forces. This new technique allows the area-specific ion exchange over boundaries to be displayed wi*h a destruction-free tech-nique by AFM in an aqueous buffer. From experiments with ISEs (ion-selective electrodes), a boundary potential for valinomycin was assumed to be established in close vicinity to a Km-releasing surface. To trace this boundary potential, an AFM tip was coated with a potassium-selective polymer film containing valinomycin as used in preparing ISEs. The K~-releasing substrate was prepared by incorporating a lipophilic potassium salt into a plasti-cized PVC layer. In contact with an electrolyte such as sodium chloride solution, an ion exchange takes place. Analogue experiments were performed using a sodium-selective ionophore, DD16C5, incorporated into the coat-ing of the AFM tip, with a Na~-releasing substrate. The boundary potential was traced and investigated with the help of force vs distance curves. The resulting adhesion forces for a valinomycin-coated tip in a 150 mM NaCI solution were 9.8 ± 3.275 nN using a blank PVC substrate and 330.15 ± 113.0 nN using a substrate containing 10 wt % potassium tetrakis(4-chlorophenyl) borate. The selectivity of the ion-selective AFM tips was measured on sodium relative to potassium-releasing substrates and studied in different salt solutions with concentrations between 10 mmol Ltand 1 mol L’. For valinomycin, a force selectivity coefficient log 4Na of—2.5 ± 0.5 for K~ against Na~ and a selectivity coefficient log K~aK of —4 ± —0.5 for DD16C5 were measured. In addition, the surface of the polymer substrate was imaged by AFM in contact mode with and without lipophilic potassium salt. The modulation of the force—distance curves induced by the ion exchange was compared to the experimental change in elasticity of the blank and ion-exchanging substrate. The Young’s moduli measured with strain force analysis on a potassium-containing substrate were 5 times smaller than the ones registered with nanoindentation and did not explain the modulation of the force vs distance curves.
机译:研究的目的是为了说明分析涂有离子选择膜的原子力显微镜(AFM)尖端的使用情况,并表明可检测到离子选择性边界电位作为由离子选择性静电相互作用引起的力,比双层力更明显。这项新技术允许通过AFM在水性缓冲液中进行无破坏的技术显示边界上特定于区域的离子交换。根据ISE(离子选择电极)的实验,假定在离Km释放表面很近的地方建立了缬霉素的边界电势。为了追踪该边界电势,在AFM尖端上涂了一层含缬氨霉素的钾选择性聚合物膜,用于制备ISE。通过将亲脂性钾盐掺入增塑的PVC层中来制备释放K +的底物。与诸如氯化钠溶液的电解质接触,发生离子交换。使用钠选择性离子载体DD16C5进行了模拟实验,该离子载体被掺入到具有Am释放基质的AFM针尖涂层中。跟踪势能并借助力与距离曲线进行研究。在150 mM NaCl溶液中,涂有新霉素的针尖所产生的粘附力,使用空白PVC基材,为9.8±3.275 nN,使用含有10 wt%硼酸四(4-氯苯基)钾的基材,为330.15±113.0 nN。相对于释放钾的底物,在钠上测量了离子选择性原子力显微镜探针的选择性,并在浓度为10 mmol Lt至1 mol L'的不同盐溶液中进行了研究。对于缬氨霉素,针对K〜对Na〜测得的力选择性系数log 4Na为-2.5±0.5,对DD16C5测得的选择性系数log K〜aK为-4±-0.5。另外,在有和没有亲脂性钾盐的情况下,通过AFM以接触模式使聚合物基材的表面成像。将由离子交换引起的力-距离曲线的调制与空白和离子交换基质的弹性实验变化进行了比较。用应变力分析在含钾基质上测得的杨氏模量比纳米压痕法测得的杨氏模量小5倍,并且不能解释力对距离曲线的调制。

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