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Electric Fields and Interference Effects inside Noncentrosymmetric Multilayer Films at Electrode Surfaces from Electrochemically Modulated Surface Plasmon Resonance Experiments

机译:电化学调制表面等离子体共振实验在电极表面非中心对称多层膜内部的电场和干扰效应

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The electric field profile inside a self-assembled noncentrosymmetric zirconium phosphonate (ZP) multilayer film at a gold electrode is determined by the in situ optical technique of electrochemically modulated surface plasmon resonance (EM-SPR). In these experiments changes in the index of refraction (△n) of a ZP film during potential modulation are measured via the EM-SPR differential reflectivity curves. Modulated SPR experiments on the ZP films incorporated into air-gap capacitors are used to relate An to changes in the electric field strength (△E) inside the film. The noncentrosymmetric ZP films utilize the nonlinear optical chromophores[5-[4-[[4-[(6-hydroxyhexyl)sulfonyl]phenyl]azo]phenyl]pentoxy]phosphonic acid (HAPA) and [1-[4-[4-[(N-(2-hydroxyethyl)-N-methyl)amino]phenyl]azo](5-phosphonopentyl)]pyridinium bromide (PY-AZO). For a 6.7 nm ZP HAPA film, a change in electrode potential (△φ↓(m)) of 50 mV corresponds to a change in electric field strength (△E) of 1.4 × 10↑(4) V/cm. EM-SPR experiments on mixed ZP multilayers of HAPA and the centrosymmetric molecule 1,10-decanediylbis-(phosphonate) are used to measure the spatial variations of the electric fields within the ultrathin films. Evidence for ion and solvent penetration into the ZP films is observed in the electrochemical environment. Additional studies of interference effects in mixed multilayers of HAPA and PY-AZO are used to verify the retention of directional order during the ZP multilayer deposition process.
机译:通过电化学调制的表面等离子体激元共振(EM-SPR)的原位光学技术确定金电极上自组装的非中心对称磷酸锆锆(ZP)多层薄膜内部的电场分布。在这些实验中,通过EM-SPR微分反射率曲线测量ZP膜在电势调制期间的折射率变化(△n)。结合到气隙电容器中的ZP薄膜的调制SPR实验用于将An与薄膜内部电场强度(△E)的变化相关联。非中心对称ZP薄膜利用了非线性光学发色团[5- [4-[[4-[(6-羟基己基)磺酰基]苯基]偶氮]苯基]戊氧基]膦酸(HAPA)和[1- [4- [4- [(N-(2-羟乙基)-N-甲基)氨基]苯基]偶氮](5-膦基戊基)]溴化吡啶鎓(PY-AZO)。对于6.7 nm ZP HAPA膜,电极电位(△φ↓(m))的变化为50 mV对应于电场强度(△E)的变化为1.4×10↑(4)V / cm。在HAPA和中心对称分子1,10-癸二基双-(膦酸酯)的混合ZP多层膜上的EM-SPR实验用于测量超薄膜中电场的空间变化。在电化学环境中观察到离子和溶剂渗透到ZP膜中的证据。 HAPA和PY-AZO混合多层中的干涉效应的其他研究用于验证ZP多层沉积过程中方向顺序的保留。

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