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Probing morphological and compositional variations of anodized carbon electrodes with tapping-mode scanning force microscopy

机译:敲击模式扫描力显微镜探测阳极氧化碳电极的形态和组成变化

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This paper demonstrates the first application of tapping-mode scanning force microscopy (TM SFM) in the compositional mapping of modified glassy carbon (GC) electrodes. Using TM SFM, we have been able to track both compositional and topographical changes of polished GC induced by electrochemical pretreatment (GC). Photoresist-based microfabrication techniques were employed to produce surfaces consisting of segregated modified and unmodified regions for direct comparison in the same image. Our results show that ECP of GC via anodization in basic solutions for short times (similar to 10 s) initially removes the ubiquitous layer of polishing debris via an etching process. Longer anodization in basic electrolyte results in significant etching of the GC surface. ECP in acidic solutions yields little topographic change compared to basic electrolytes. Electrochemical results obtained for three redox systems studied on both modified and unmodified GC electrodes correlate with the TM SFM images collected. [References: 56]
机译:本文演示了敲击模式扫描力显微镜(TM SFM)在改性玻璃碳(GC)电极的成分映射中的首次应用。使用TM SFM,我们已经能够跟踪由电化学预处理(GC)诱导的抛光GC的成分和形貌变化。基于光致抗蚀剂的微细加工技术可用于生产由隔离的修饰区域和未修饰区域组成的表面,以便在同一图像中进行直接比较。我们的结果表明,通过在碱性溶液中进行短时间(类似于10 s)的阳极氧化处理,GC的ECP最初会通过蚀刻工艺去除普遍存在的抛光碎片层。碱性电解液中较长的阳极氧化作用会导致GC表面的明显腐蚀。与碱性电解质相比,酸性溶液中的ECP几乎不会产生形貌变化。在修饰的和未修饰的GC电极上研究的三个氧化还原系统获得的电化学结果与收集的TM SFM图像相关。 [参考:56]

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