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首页> 外文期刊>ACS applied materials & interfaces >Single GaAs Nanowire/Graphene Hybrid Devices Fabricated by a Position-Controlled Microtransfer and an Imprinting Technique for an Embedded Structure
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Single GaAs Nanowire/Graphene Hybrid Devices Fabricated by a Position-Controlled Microtransfer and an Imprinting Technique for an Embedded Structure

机译:由位置控制的MicrotRansfer制造的单个GaAs纳米线/石墨烯混合装置和用于嵌入式结构的压印技术

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We developed a new technique to fabricate single nanowire devices with reliable graphene/nanowire contacts using a position-controlled microtransfer and an embedded nanowire structure in a planar junction configuration. A thorough study of electrical properties and fabrication challenges of single p-GaAs nanowire/graphene devices was carried out in two different device configurations: (1) a graphene bottom-contact device where the nanowire-graphene contact junction is formed by transferring a nanowire on top of graphene and (2) a graphene top-contact device where the nanowire-graphene contact junction is formed by transferring graphene on top of an embedded nanowire. For the graphene top-contact devices, graphene nanowire-metal-devices, where graphene is used as one electrode and metal is the other electrode to a nanowire, and graphene nanowire-graphene-devices, where both electrodes to a nanowire are graphene, were investigated and compared with conventional metal/p-GaAs nanowire devices. Conventional metal/p-GaAs nanowire contact devices were further investigated in embedded and nonembedded nanowire device configurations. A significantly improved current in the embedded device configuration is explained with a "parallel resistors model" where the high-resistance parts with the metal-semiconductor Schottky contact and the low-resistance parts with noncontacted facets of the hexagonal nanowires are taken into consideration. Consistently, the nonembedded nanowire structure is found to be depleted much easier than the embedded nanowires from which an estimation for a fully depleted condition has also been established.
机译:我们开发了一种新技术,用于使用位置控制的微旋转传输和嵌入的纳米线结构在平面结构造中使用可靠的石墨烯/纳米线触点来制造单个纳米线装置。在两个不同的装置配置中进行了对单个P-GaAs纳米线/石墨烯装置的电性能和制造挑战的彻底研究:(1)通过转移纳米线形成纳米线 - 石墨烯接触结的石墨烯底部接触装置石墨烯顶部和(2)石墨烯顶触头装置,其中纳米线 - 石墨烯接触结通过在嵌入的纳米线的顶部转移石墨烯形成。对于石墨烯顶接触装置,石墨烯纳米线 - 金属装置,其中石墨烯作为一个电极和金属是纳米线的另一个电极,以及石墨烯纳米线 - 石墨烯 - 器件,其中两个电极都是石墨烯。研究并与常规金属/ P-GaAs纳米线装置进行了比较。进一步研究了常规的金属/ P-GaAs纳米线接触装置,在嵌入式和非致密的纳米线装置配置中进一步研究。用“并联电阻模型”解释嵌入式设备配置中的显着改善的电流,其中“并联电阻模型”,其中具有金属半导体肖特基触点的高电阻部件和具有六边形纳米线的非接触式刻面的低电阻部件。始终如一地,发现非致密的纳米线结构比嵌入式纳米线更容易地耗尽,从中建立了完全耗尽的条件的估计。

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