Atomic force micro'/>
机译:打破凯尔文探头力显微镜中的时间屏障:使用G模式平台的快速自由力重建
Center for Nanophase Materials Sciences and Institute for Functional Imaging of Materials Oak Ridge National Laboratory Oak Ridge Tennessee 37831 United States;
Joint Institute for Advanced Materials Department of Materials Science and Engineering University of Tennessee Knoxville 37996 United States;
Joint Institute for Advanced Materials Department of Materials Science and Engineering University of Tennessee Knoxville 37996 United States;
Joint Institute for Advanced Materials Department of Materials Science and Engineering University of Tennessee Knoxville 37996 United States;
Center for Nanophase Materials Sciences and Institute for Functional Imaging of Materials Oak Ridge National Laboratory Oak Ridge Tennessee 37831 United States;
Center for Nanophase Materials Sciences and Institute for Functional Imaging of Materials Oak Ridge National Laboratory Oak Ridge Tennessee 37831 United States;
atomic force microscopy; ion migration; perovskite solar cells; time-resolved Kelvin probe force microscopy; ultrafast AFM;
机译:打破凯尔文探头力显微镜中的时间屏障:使用G模式平台的快速自由力重建
机译:使用原子力显微镜/开尔文探针力显微镜/扫描电容力显微镜观察施加反向偏压下的碳化硅肖特基势垒二极管
机译:自然钝化过程在碱性介质中对AISI 304的时间依赖性:原子力显微镜和扫描开尔文探针力显微镜是电化学阻抗谱的附加工具
机译:开尔文探针力显微镜:测量数据重建
机译:开尔文探头力显微镜的基础及其在太阳能电池特征中的应用
机译:开尔文探针力显微镜在环境大气中的金属/半导体界面的纳米级表面电势势垒
机译:打破塞尔文探头力显微镜中的时间屏障:使用GEGODE平台的快速自由力重建