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Effects of Defects on Band Structure and Excitons in WS2 Revealed by Nanoscale Photoemission Spectroscopy

机译:纳米尺度光学激光光谱揭示WS2中带状结构和激子缺陷的影响

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摘要

Two-dimensional materials with engineered composition and structure will provide designer materials beyond conventional semiconductors. However, the potentials of defect engineering remain largely untapped, because it hinges on a precise understanding of electronic structure and excitonic properties, which are not yet predictable by theory alone. Here, we utilize correlative, nanoscale photoemission spectroscopy to visualize how local introduction of defects modifies electronic and excitonic properties of two-dimensional materials at the nanoscale. As a model system, we study chemical vapor deposition grown monolayer WS2, a prototypical, direct gap, two-dimensional semiconductor. By cross-correlating nanoscale angle-resolved photoemission spectroscopy, core level spectroscopy, and photoluminescence, we unravel how local variations in defect density influence electronic structure, lateral band alignment, and excitonic phenomena in synthetic WS2 monolayers.
机译:具有工程化组成和结构的二维材料将提供超出常规半导体的设计者材料。 然而,缺陷工程的潜力仍然很大程度上是未开发的,因为它能够精确地理解电子结构和激子属性,这对单独的理论尚未预测。 在这里,我们利用相关的纳米级光学激发光谱,以可视化局部引入缺陷的引入方式如何在纳米级上修改二维材料的电子和激发性能。 作为模型系统,我们研究化学气相沉积种植单层WS2,原型,直接间隙,二维半导体。 通过交叉相关纳米级角度分辨的光曝光光谱,核心水平光谱和光致发光,我们解开缺陷密度的局部变化如何影响合成的WS2单层中的电子结构,横向带对准和激子现象。

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