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A quantitative comparison of in-line coating thickness distributions obtained from a pharmaceutical tablet mixing process using discrete element method and terahertz pulsed imaging

机译:使用离散元件法和太赫兹脉冲成像从药片混合过程中获得的在线涂层厚度分布的定量比较

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The application of terahertz pulsed imaging (TPI) in an in-line configuration to monitor the coating thickness distribution of pharmaceutical tablets has the potential to improve the performance and quality of the spray coating process. In this study, an in-line TPI method is used to measure coating thickness distributions on pre-coated tablets during mixing in a rotating pan, and compared with results obtained numerically using the discrete element method (DEM) combined with a ray-tracing technique. The hit rates (i.e. the number of successful coating thickness measurements per minute) obtained from both terahertz in-line experiments and the DEM/ray-tracing simulations are in good agreement, and both increase with the number of baffles in the mixing pan. We demonstrate that the coating thickness variability as determined from the ray-traced data and the terahertz in-line measurements represents mainly the intra-tablet variability due to relatively uniform mean coating thickness across tablets. The mean coating thickness of the ray-traced data from the numerical simulations agrees well with the mean coating thickness as determined by the off-line TPI measurements. The mean coating thickness of in-line TPI measurements is slightly higher than that of the off-line measurements. This discrepancy can be corrected based on the cap-to-band surface area ratio of the tablet and the cap-to-band sampling ratio obtained from ray-tracing simulations: the corrected mean coating thickness of the in-line TPI measurements shows a better agreement with that of the off-line measurements. (C) 2018 Published by Elsevier Ltd.
机译:Terahertz脉冲成像(TPI)在线构型以监测药物片剂的涂层厚度分布具有提高喷涂过程的性能和质量的潜力。在该研究中,在线TPI方法用于测量在旋转平底锅中混合期间预涂层片上的涂层厚度分布,并与使用离散元素法(DEM)进行数值而获得的结果与光线跟踪技术相比。从太赫兹在线实验和DEM /射线跟踪模拟中获得的击中率(即每分钟的成功涂层厚度测量数量)非常一致,并且随着混合锅中的挡板数量增加。我们证明,由光线跟踪数据和太赫兹在线测量确定的涂层厚度可变性主要是由于片剂相对均匀的平均涂层厚度引起的片内变异性。来自数值模拟的射线跟踪数据的平均涂层厚度与由离线TPI测量确定的平均涂层厚度吻合良好。在线TPI测量的平均涂层厚度略高于离线测量。这种差异可以基于平板电脑的帽与带表面面积比和从射线跟踪模拟获得的帽带采样比率校正:在线TPI测量的校正平均涂层厚度显示更好与离线测量的同意。 (c)2018由elestvier有限公司出版

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