首页> 外文OA文献 >Measurement of the Intertablet Coating Uniformity of a Pharmaceutical Pan Coating Process With Combined Terahertz and Optical Coherence Tomography In-Line Sensing.
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Measurement of the Intertablet Coating Uniformity of a Pharmaceutical Pan Coating Process With Combined Terahertz and Optical Coherence Tomography In-Line Sensing.

机译:结合了太赫兹和光学相干断层扫描在线传感技术的药物锅包衣过程的片剂间包衣均匀度的测量。

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摘要

We present in-line coating thickness measurements acquired simultaneously using two independent sensing modalities: terahertz pulsed imaging (TPI) and optical coherence tomography (OCT). Both techniques are sufficiently fast to resolve the coating thickness of individual pharmaceutical tablets in-situ during the film coating operation and both techniques are direct structural imaging techniques that do not require multivariate calibration. The TPI sensor is suitable to measure coatings greater than 50 μm and can penetrate through thick coatings even in the presence of pigments over a wide range of excipients. Due to the long wavelength, terahertz radiation is not affected by scattering from dust within the coater. In contrast, OCT can resolve coating layers as thin as 20 μm and is capable of measuring the intra-tablet coating uniformity as well as the inter-tablet coating thickness distribution within the coating pan. ¬-However, the OCT technique is less robust when it comes to the compatibility with excipients, dust and potentially the maximum coating thickness that can be resolved. Using a custom built laboratory scale coating unit, the coating thickness measurements were acquired independently by the TPI and OCT sensors throughout a film coating operation. Results of the in-line TPI and OCT measurements were compared against one another and validated with off-line TPI and weight gain measurements. Compared to other process analytical technology (PAT) sensors, such as near-infrared and Raman spectroscopy, the TPI/OCT sensors can resolve the inter-tablet thickness distribution based on sampling a significant fraction of the tablet populations in the process. By combining two complementary sensing modalities it was possible to seamlessly monitor the coating process over the range of film thickness from 20 μm to greater than 250 μm.
机译:我们介绍使用两种独立的感应方式同时获取的在线涂层厚度测量值:太赫兹脉冲成像(TPI)和光学相干断层扫描(OCT)。两种技术都足够快,可以在薄膜包衣操作期间原位解决单个药物片剂的包衣厚度,并且两种技术都是直接的结构成像技术,不需要多变量校准。 TPI传感器适用于测量大于50μm的涂层,即使存在多种赋形剂中的颜料,TPI传感器也可以穿透厚涂层。由于波长长,太赫兹辐射不受镀膜机内灰尘散射的影响。相比之下,OCT可以分辨出厚度仅为20μm的涂层,并且能够测量平板电脑内部涂层的均匀性以及平板间涂层的厚度。 ¬但是,OCT技术在与赋形剂,粉尘以及可能解决的最大涂层厚度的相容性方面不那么可靠。使用定制的实验室规模的涂布装置,在整个薄膜涂布过程中,TPI和OCT传感器可独立获取涂层厚度测量值。在线TPI和OCT测量的结果相互比较,并通过离线TPI和体重增加测量进行了验证。与其他过程分析技术(PAT)传感器(例如近红外和拉曼光谱法)相比,TPI / OCT传感器可以基于对过程中很大一部分片剂种群的采样来解析片剂之间的厚度分布。通过组合两种互补的感应方式,可以在20μm到大于250μm的膜厚范围内无缝监控涂覆过程。

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