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首页> 外文期刊>CERAMICS INTERNATIONAL >Phase structure evolution, crystal structure refinement, morphology, and electro-optical properties of heat-treated Ca0.9Ni0.1Cu2.9La0.1Ti4O12
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Phase structure evolution, crystal structure refinement, morphology, and electro-optical properties of heat-treated Ca0.9Ni0.1Cu2.9La0.1Ti4O12

机译:相结构演化,晶体结构细化,形态学和电热处理的热处理CA0.9NI0.1CU2.9LA0.1TI4O12

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Ni2+-La3+ substituted CCTO ceramic was fabricated via sol-gel autocombustion method. After calcination at 800 degrees C for 6 h, the heat-treatment temperature was varied from 800 degrees C to 1000 degrees C. The samples were labelled T1, T2, T3 and T4 to represent heat-treatment temperature of 800 degrees C, 800/800 degrees C, 800/900 degrees C, and 800/1000 degrees C respectively. The effect of this variation in temperature on the optical, dielectric, morphology, phase as well as crystal structure evolution was studied using various characterization tools. The XRD spectra confirm the presence of secondary phases such as CaTiO3, CuO, and anatase phase of TiO2 in all the samples except the sample with T4. However, Raman spectroscopy shows that the sample with T4 contains some amount of these secondary phases; this contradiction arises because of the better sensitivity of Raman spectroscopy as compared to XRD. The morphology of the prepared Ni2+-La3+ substituted CCTO ceramic tend to evolve with temperature as observed in FESEM micrographs, the known cubic shape of CCTO ceramic evolves with increase in temperature and becomes dominant in the sample with T4. The observed inter planar spacing in the HRTEM support the values observed from XRD analysis whereas the SAED pattern indicate that the Ni2+-La3+ substituted CCTO ceramic is polycrystalline in nature. The plot of band gap against changes in heat-treatment temperature shows a decreasing behaviour with increase in heat-treatment temperature which could be ascribed to changes in the local atomic lattice of the Ni2+-La3+ substituted CCTO ceramic. The dielectric properties were explained according to internal barrier layer capacitance (IBLC) model. Dielectric analysis shows that the sample with T4 exhibits the highest values of dielectric constant (40400) at low frequency which we assumed to be a consequence of space charge polarization.
机译:通过溶胶 - 凝胶自动掩模方法制造Ni2 + -La3 +取代的Ccto陶瓷。在800℃下煅烧6小时后,将热处理温度从800℃变化至1000℃。样品标记为T1,T2,T3和T4,以表示800摄氏度的热处理温度,800 / 800℃,800/900摄氏度,分别为800/1000℃。使用各种特征工具研究了温度温度变化对光学,电介质,形态,相位以及晶体结构演化的影响。除了具有T4之外的所有样品之外,XRD光谱确认了除样品之外的所有样品中的次生次级,例如CatiO3,CuO和TiO 2的锐钛矿相。然而,拉曼光谱表明,具有T4的样品含有一些这些二阶段;与XRD相比,这种矛盾是由于拉曼光谱的敏感性更好。所制备的Ni2 + -La3 +取代的CCTO陶瓷的形态倾向于在雌性显微照片中观察到的温度随温度而发展,CCTO陶瓷的已知立方形状随着温度的增加而演变,并且在样品中与T4中的显着显着。 HRTEM中观察到的平面间距支持从XRD分析观察的值,而SAED图案表明Ni2 + -La3 +取代的Ccto陶瓷本质上是多晶。带间隙的曲线曲线抗热处理温度的变化表明,随着热处理温度的增加,可以归因于Ni2 + -La3 +取代的Ccto陶瓷的局部原子晶格的变化的降低。根据内部阻挡层电容(IBLC)模型来解释电介质性质。介电分析表明,具有T4的样品在低频上表现出介电常数(40400)的最高值,这是我们假设的空间电荷极化的结果。

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