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A 1.3-Gsample/s interpolation with flash CMOS ADC based on active interpolation technique

机译:基于有源插值技术的具有闪存CMOS ADC的1.3Gsample / s插值

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In this paper, the design of a high-speed low-voltage CMOS interpolation with flash analog-to-digital converter (ADC) in CMOS 0.18-μm process is presented. The use of summing differential amplifiers operating in continuous time for interpolation and resistor averaging circuit have significantly improved the circuit's linearity. The new interpolation technique has improved the pertinent phase delay problem of voltage interpolation enormously. A technique to reduce metastability errors in the Error Correction Circuitry is also presented. The circuit achieves a maximum sampling speed of 1.3 GHz. The measured signal-to-noise-plus-distortion ration (SNDR) is 32 dB at 500 MHz. Peak DNL and INL are less than 0.15 LSB and 0.35 LSB, respectively. This ADC consumes about 600 mW from 1.8 V at full speed. The chip occupies 0.56-mm{sup}2 active area, prototyped in CMOS 0.18-μm technology.
机译:本文提出了一种采用CMOS0.18μm工艺的带有闪存模数转换器(ADC)的高速低压CMOS插值设计。连续工作的求和差分放大器用于内插和电阻平均电路的使用大大改善了电路的线性度。新的插值技术极大地改善了电压插值的相关相位延迟问题。还提出了一种减少误差校正电路中亚稳态误差的技术。该电路的最大采样速度为1.3 GHz。在500 MHz时,测得的信噪比失真比(SNDR)为32 dB。峰值DNL和INL分别小于0.15 LSB和0.35 LSB。该ADC在全速时从1.8 V消耗约600 mW的功率。该芯片占用0.56-mm {sup} 2的有效面积,采用CMOS0.18-μm技术原型化。

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