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Prototype of a nanoindentation instrument with an optical fiber interferometer

机译:纳米压痕 仪 的 与光纤 干涉仪 样机

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A prototype of a nanoindetation instrument with an optical fiber interferometer has been developed. The instrument is designed for future installation in a scanning electron microscope. The instrument consists of a specially designed load cell, an optical fiber interferometer and piezoelectric actuators. Resolution of the load cell and the interferometer were 100μN and 0.1 nm respectively. The load frame compliance of the instrument was estimated as 3.36 nm/mN with a standard hardness block of 400 HV. The measured hardness values for a standard hardness block of 900 HV were well agreed with the results measured by using UMIS-2000 in another report.
机译:已经开发了具有光纤干涉仪的纳米inetation仪器的原型。 该仪器设计用于扫描电子显微镜中的未来安装。 该仪器由特殊设计的负载电池,光纤干涉仪和压电致动器组成。 分辨率分辨率和干涉仪分别为100μl和0.1nm。 仪器的负载框架符合性估计为3.36nm / mn,具有400 HV的标准硬度块。 通过在另一个报告中使用Umis-2000测量的结果,对标准硬度块的测量硬度值很好地同意。

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