A Quick Method of Evaluation for Commercial Atomic Force Microscope

摘要

Atomic force microscope (AFM) has been widely used in the field of surface measurement. Selection of a proper AFM with cost-effective performance from numerous domestic and oversea makers becomes an important purchasing issue for most of users, especially who are not familiar with the functions of AFM. In this article, five characteristics of AFM scanned images under the most frequently used tapping mode are thoroughly deliberated. They are the best image resolution of Z axis, the spatial repetitions of the images, the sharpness of single step line (the real image resolution of lateral axis), the distortion of a single step line and the spatial drift of the images (the long term of stability for continuous use) on HOPG. The outcome of these qualities can serve as a quick guide for evaluating an AFM.