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首页> 外文期刊>粉体および粉末冶金 >High Rate Deposition of Mn-Zn Spinel Ferrite Thin Films Using Reactive Facing-Target Sputtering
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High Rate Deposition of Mn-Zn Spinel Ferrite Thin Films Using Reactive Facing-Target Sputtering

机译:Mn-Zn尖晶石铁氧体薄膜使用反应靶溅射的高速率沉积

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摘要

Mn-Zn spinel ferrite thin films were prepared on a Pt underlayer by reactive facing-targets sputtering to increase the deposition rate to improve the productivity. The film prepared at P_(O2) of 25 percent crystallized and possessed 4 pi M, of 3.4 kG. The discharge voltage changed with P_(O2) because of the oxidation of the target surface. The discharge voltage-current characteristics were examined to clarify the extent of oxidation of the target's. It was found that a proper discharge voltage is required to prepare Mn-Zn ferrite films. Although saturation magnetization increased with increase in substrate temperature, the surface roughness also increased. By thinning the Mn-Zn ferrite films and inserting the hyperoxidized layer that showed flat surface as the interlayer, the surface roughness of the film decreased from 4.4 nm to 2.8 nm. Saturation magnetization was improved from 3.4 kG to 4.8 kG in the same preparation condition (T_s =400 deg C, P_(O2) = 25 percent) by adjusting the inlet position of O_2 gas. By using the new method, the deposition rate increased to be 16 times that of the conventional method.
机译:通过反应性面对靶溅射在PT底层上制备Mn-Zn尖晶石铁氧体薄膜以增加沉积速率以提高生产率。在25%的P_(O 2)中制备的薄膜结晶并具有3.4kg的4 pi m。由于目标表面的氧化,通过P_(O2)改变了放电电压。检查放电电压 - 电流特性以阐明目标的氧化程度。发现准备Mn-Zn铁氧体膜需要适当的放电电压。尽管饱和磁化随衬底温度的增加而增加,但表面粗糙度也增加。通过将Mn-Zn铁素体薄膜稀释并插入显示平坦表面作为中间层的硫化层,膜的表面粗糙度从4.4nm降低到2.8nm。通过调节O_2气体的入口位置,在相同的制备条件(T_S = 400℃,P_(O2)= 25%)中,从3.4kg提高到4.4kg至4.8kg。通过使用新方法,沉积速率增加到传统方法的16倍。

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