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首页> 外文期刊>電子情報通信学会技術研究報告. フォ-ルトトレラントシステム >Self-checking multiple-valued integrated circuit based on dual-rail current-mode logic and its application to a high-performance arithmetic VLSI system
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Self-checking multiple-valued integrated circuit based on dual-rail current-mode logic and its application to a high-performance arithmetic VLSI system

机译:基于双轨电流模式逻辑的自检多值集成电路及其在高性能算术VLSI系统中的应用

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摘要

This paper presents a new totally self-checking circuit based on dual-rail multiple-valued current-mode (MVCM) logic where almost all the basic components except a differential-pair circuit have been already duplicated, which results in small hardware overhead compared with a non-self-checking circuit based on dual-rail MVCM logic. It is demonstrated in a 0.35-μm CMOS technology that the performance of the 8×8-bit multiplier based on the proposed self-checking circuit is superior to that of full duplication of the non self-checking circuit based on dual-rail MVCM logic in terms of chip area and dynamic power dissipation under the same switching delay.
机译:本文提出了一种基于双轨多值电流模式(MVCM)逻辑的新型自我检查电路,其中除了差分对电路之外的几乎所有基本组件都已重复,这导致与...相比的小硬件开销。 基于双轨MVCM逻辑的非自动检查电路。 基于所提出的自检电路的8×8位乘数的性能优于基于双轨MVCM逻辑的非自检电路的全重复性的0.35微米CMOS技术。 在相同的开关延迟下芯片区域和动态功耗方面。

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