首页> 外文期刊>Journal of Thermal Spray Technology >Determination of Triaxial Residual Stress in Plasma-Sprayed Hydroxyapatite (HAp) Deposited on Titanium Substrate by X-ray Diffraction
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Determination of Triaxial Residual Stress in Plasma-Sprayed Hydroxyapatite (HAp) Deposited on Titanium Substrate by X-ray Diffraction

机译:X射线衍射沉积在钛基材上沉积在钛基底上的血浆喷涂羟基磷灰石(HAP)中的三轴残余应激

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摘要

Measurement of residual stress in plasma-sprayed coating is of key importance to optimize their microstructure and mechanical properties. In this study, the x-ray diffraction analysis was carried out using the sin(2) method to evaluate the residual stress distribution of hydroxyapatite (HAp) coatings produced on titanium substrate by atmospheric plasma spraying (APS) and vacuum plasma spraying (VPS). The sin(2) method measured strains at different tilt and rotating phi angles around the specimen surface normal. A non-uniform and inhomogeneous stress distribution was present in the both coatings. The measured strain epsilon(phi) is plotted versus sin(2), showing a nonlinear (elliptical) behavior, which indicates the presence of inhomogeneous triaxial stress distributions within coating, due to the crystalline anisotropy, inhomogeneous cooling rate or solidification of the molten particles. The normal stress values within both HAp coatings produced were found to be tensile in nature, but the values of tensile stresses are significantly higher in APS coating than those values obtained for VPS coating.
机译:测量等离子体喷涂涂层残余应力是关键重要性,以优化其微观结构和机械性能。在该研究中,使用SIN(2)方法进行X射线衍射分析,以评价通过大气等离子体喷涂(AP)和真空等离子体喷涂(VPS)在钛基材上产生的羟基磷灰石(HAP)涂层的残余应力分布(VPS) 。 SIN(2)方法测量不同倾斜的菌株并在样品表面周围旋转PHI角度。两种涂层中存在不均匀和不均匀的应力分布。绘制的测量菌株ε(pHI)与SIN(2)绘制,显示出非线性(椭圆形)行为,其表示涂层内的非均匀三轴应力分布,由于结晶各向异性,不均匀的冷却速率或熔融颗粒的凝固物。发现产生的两种HAP涂层内的正常应力值在自然界中是拉伸的,但在APS涂层中拉伸应力的值显着高于对VPS涂层获得的那些值。

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