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首页> 外文期刊>Journal of the Korean Physical Society >Optimization by Numerical Simulation of the Active Layer's Thickness for Organic Thin Film Transistor
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Optimization by Numerical Simulation of the Active Layer's Thickness for Organic Thin Film Transistor

机译:有机薄膜晶体管有源层厚度的数值模拟优化

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摘要

This paper reports the performance of a pentacene-based organic thin film transistor (OTFT) that was investigated using numerical simulations for different pentacene thicknesses. The studied OTFTs showed a peak mobility in the saturation region of 5 x 10 (-2) cm(2)V (-1)s (-1) for a pentacene thickness of 50 nm. Furthermore, an optimum I-on/I-off current ratio of 3.5 x 10(5) was observed for a similar pentacene thickness of about 50 nm. Moreover, the threshold voltage and the sub-threshold slope were significantly affected and decreased with increasing pentacene thickness. In addition, based on our proposed approach and the simulation results, we noticed that a penatcene thickness of 50 nm remained the optimum value for the active layer channel in order to obtain optimal performance from the OTFT devices.
机译:本文报道了使用数值模拟进行不同五烯胶质厚度来研究的基于五烯类的有机薄膜晶体管(OTFT)的性能。 所研究的OTFT显示在5×10(-2)厘米(2)厘米(-1)℃(-1)的饱和区中的峰迁移率,其戊烯厚度为50nm。 此外,观察到3.5×10(5)的最佳I-ON / I-OFF电流比,其与约50nm的相似的戊烯厚度。 此外,阈值电压和副阈值斜率随着五苯厚度的增加而显着影响和降低。 此外,基于我们所提出的方法和仿真结果,我们注意到,50nm的角性厚度仍然是有源层通道的最佳值,以便从OTFT器件获得最佳性能。

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