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机译:Ni扩散对还原气氛下钪稳定氧化锆膜加速电导率降解的影响
Korea Inst Energy Res Energy Mat &
Convergence Res Dept 152 Gajeong Ro Daejeon 305343 South Korea;
Chungbuk Natl Univ Dept Adv Mat Engn 1 Chungdae Ro Cheongju 28644 Chungbuk South Korea;
Samsung Elect Platform Technol Lab 130 Samsung Ro Suwon 443803 Gyeonggi Do South Korea;
Korea Inst Energy Res Energy Mat &
Convergence Res Dept 152 Gajeong Ro Daejeon 305343 South Korea;
Korea Inst Energy Res Energy Mat &
Convergence Res Dept 152 Gajeong Ro Daejeon 305343 South Korea;
Korea Inst Energy Res Energy Mat &
Convergence Res Dept 152 Gajeong Ro Daejeon 305343 South Korea;
Chungbuk Natl Univ Dept Adv Mat Engn 1 Chungdae Ro Cheongju 28644 Chungbuk South Korea;
Solid oxide fuel cell; Scandia-stabilized zirconia; Ni diffusion; Conductivity degradation; Raman spectroscopy;
机译:还原气氛下镍扩散对scan稳定氧化锆膜加速电导降解的影响
机译:scan稳定氧化锆薄膜离子电导率的集成实验与模型研究
机译:镍掺杂对scan稳定氧化锆相稳定性和电导率的影响
机译:Scandia稳定氧化锆薄膜的电导率
机译:新型二氧化铈-氧化锆-氧化钇介观结构:合成,表征,扩散研究和形态对其特性的影响
机译:氧化钇稳定的氧化锆薄膜中18O示踪剂扩散系数的测量
机译:通过瞬时闪光照射制备Scandia稳定的氧化锆薄膜