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首页> 外文期刊>Journal of Semiconductors >Effect of organic amine alkali and inorganic alkali on benzotriazole removal during post Cu-CMP cleaning
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Effect of organic amine alkali and inorganic alkali on benzotriazole removal during post Cu-CMP cleaning

机译:有机胺碱和无机碱对Cu-CMP清洗后苯并三唑去除的影响

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摘要

Benzotriazole (BTA), an anticorrosion agent of slurry, is the main organic pollutant remaining after CMP of multilayer copper wiring, and also the main removal object of post CMP cleaning. The adsorption of BTA onto the copper could form a dense Cu-BTA film, which makes the copper surface strongly passivated. According to this characteristic, quantitative analysis of BTA residue after cleaning is carried out by contact angle measurement and electrochemical measurement in this paper. A scanning electron microscope (SEM) with EDX was used to observe and analyze the BTA shape and elements. The efficiencies of organic alkali and inorganic alkali on the removal of BTA were studied. The corresponding reaction mechanism was also analyzed. The results show that the adsorption structure of Cu(I)-BTA cannot be destroyed in an alkaline environment with a pH less than 10; the effect of BTA removal by inorganic alkali is worse than that of the organic amine alkali with the coordination structure under the same pH environment; the FA/O II chelating agent with the fraction of 200 ppm can effectively remove BTA residue on the surface of copper wafer.
机译:苯并三唑(BTA)是浆料的防腐剂,是Mudayer铜线CMP后剩余的主要有机污染物,以及CMP清洗后的主要清除对象。 BTA在铜上的吸附可以形成致密的Cu-BTA膜,使铜表面钝化。根据该特征,通过本文的接触角测量和电化学测量进行了清洗后的BTA残基的定量分析。使用EDX的扫描电子显微镜(SEM)观察和分析BTA形状和元素。研究了有机碱和无机碱对BTA去除的效率。还分析了相应的反应机理。结果表明,Cu(I)-BTA的吸附结构不能在碱性环境中破坏,pH小于10;通过在相同pH环境下,无机碱通过无机碱除去的BTA除去的效果比有机胺碱的配位结构更差; FA / O II螯合剂具有200ppm的级分可以有效地除去铜晶片表面上的BTA残基。

著录项

  • 来源
    《Journal of Semiconductors》 |2018年第12期|共5页
  • 作者单位

    School of Electronics and Information Engineering Hebei University of Technology Tianjin 300130 China;

    School of Electronics and Information Engineering Hebei University of Technology Tianjin 300130 China;

    School of Electronics and Information Engineering Hebei University of Technology Tianjin 300130 China;

    School of Electronics and Information Engineering Hebei University of Technology Tianjin 300130 China;

    The 45th Research Institute of CETC Beijing 100176 China;

    School of Electronics and Information Engineering Hebei University of Technology Tianjin 300130 China;

    School of Electronics and Information Engineering Hebei University of Technology Tianjin 300130 China;

    School of Electronics and Information Engineering Hebei University of Technology Tianjin 300130 China;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

    post CMP cleaning; benzotriazole (BTA); organic amine alkali; electrochemical measurement;

    机译:CMP清洗后;苯并三唑(BTA);有机胺碱;电化学测量;

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