首页> 外文期刊>Journal of the American Society for Mass Spectrometry >Plasma-Based Ambient Desorption/Ionization Mass Spectrometry for the Analysis of Liquid Crystals Employed in Display Devices
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Plasma-Based Ambient Desorption/Ionization Mass Spectrometry for the Analysis of Liquid Crystals Employed in Display Devices

机译:基于等离子体的环境解吸/电离质谱分析显示装置中使用的液晶

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摘要

Liquid-crystal displays (LCDs) are the most frequently used display technology worldwide these days. Due to the rather complex manufacturing process and purity requirements for the chemicals used, quality control and display failure analysis are important analytical tasks. Currently, the state-of-the-art techniques (e.g., high-performance liquid chromatography (HPLC), gas chromatography (GC) coupled to mass spectrometry (MS), time-of-flight secondary ion mass spectrometry (TOF-SIMS), or high-resolution microscopy) are costly and time-consuming. Hence, a new pathway to precisely analyze liquid-crystalline materials and LCDs in their native state is reported. A new approach for direct analysis via plasma-based ambient desorption/ionization mass spectrometry (ADI-MS) offers an inexpensive and faster alternative. In this study, direct analysis in real time (DART), the low-temperature plasma (LTP) probe, and flowing atmospheric-pressure afterglow (FAPA) ADI sources coupled to high-resolution mass spectrometry (HR-MS) are compared based on their capabilities and performance for liquid-crystal analysis. These sources enable direct analyte desorption from a sample surface at ambient conditions and ionize the vaporized analyte molecules in a subsequent step. Primarily, the ionization capabilities of the three ADI sources are compared for individual liquid-crystal standards, mixtures of liquid crystals (LCs), and complex liquid crystal/additive mixtures applied in commercially available LCDs. Furthermore, direct surface analysis from a glass substrate is also performed with ADI-MS to compare their applicability to this type of sample matrix.
机译:液晶显示器(LCD)这些天是全球最常用的显示技术。由于所使用的化学品的制造工艺和纯度要求,质量控制和显示故障分析是重要的分析任务。目前,最先进的技术(例如,高性能液相色谱(HPLC),偶联至质谱(MS),飞行时间二次离子质谱(TOF-SIMS)的气相色谱(GC)或高分辨率显微镜)昂贵且耗时。因此,报道了一种新的途径,以精确地分析其天然状态的液晶材料和LCD。通过基于等离子体的环境解吸/电离质谱(ADI-MS)的一种新方法提供了廉价且更快的替代品。在该研究中,基于,实时(DART),低温等离子体(LTP),低温等离子体(LTP)探针和流动的大气压后粘度(FAPA)ADI源进行了直接分析,耦合到高分辨率质谱(HR-MS)。它们对液晶分析的能力和性能。这些来源使得在环境条件下从样品表面的直接分析物解吸,并在随后的步骤中电离蒸发的分析物分子。主要是,将三种ADI源的电离能力与单个液晶标准,液晶(LC)的混合物进行比较,以及在市售的LCD中施加的复合液晶/添加剂混合物。此外,还使用ADI-MS进行来自玻璃基板的直接表面分析,以比较它们对这种类型的样品基质的适用性。

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