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首页> 外文期刊>Journal of the American Society for Mass Spectrometry >Ion-Neutral Collision Effects on Ion Trapping and Pseudopotential Depth in Ion Trap Mass Spectrometry
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Ion-Neutral Collision Effects on Ion Trapping and Pseudopotential Depth in Ion Trap Mass Spectrometry

机译:离子阱质谱法对离子捕获和伪软化深度的离子中性碰撞效应

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Ion trapping using radio-frequency (RF) devices has been widely used in mass spectrometry (MS). The pseudopotential well (PW) model enables the use of a pseudopotential depth, D, to evaluate the ion trapping capability of the RF devices in the pure electric field. It remains unclear how gas pressures regulate the ion trapping and D. Here, we calculated the D of a linear ion trap (LIT) from 1 mTorr to 2 Torr, a pressure range critical for the operation of the RF devices, through ion cloud simulations. Compared with the case of pure electric field, ion-neutral collision effects at pressures of 1 to 100 mTorr were beneficial for the ion trapping and revealed an optimal trapping depth, D, at around 10 mTorr. We explained the mechanism and validated the observation via ion trapping experiments performed in a home-made dual LIT mass spectrometer. We also showed that near the stability boundary, the RF heating became comparable with the D, which led to the decrement of ion trapping capability characterized by the available D.
机译:使用射频(RF)器件的离子俘获已广泛用于质谱(MS)。假软阱(PW)模型能够使用伪能照深度D,以评估纯电场中RF器件的离子捕获能力。仍然尚不清楚气体压力如何调节离子俘获和D.在这里,我们计算了从1毫托到2托的线性离子阱(点亮)的d,通过离子云模拟来计算RF器件的操作至关重要的压力范围。与纯电场的情况相比,1至100毫托的压力下的离子中性碰撞效应有利于离子捕获,并揭示了最佳的捕获深度,d,约为10 mtorr。我们解释了该机制并通过在自制双点亮质谱仪中进行的离子捕获实验进行了验证了观察。我们还表明,靠近稳定性边界,RF加热与D相当,导致离子捕获能力的减少,其特征在于可用的D.

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