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机译:白光干涉测量中结构表面的快速测量方法
State Key Laboratory of Digital Manufacturing Equipment and TechnologySchool of Mechanical Science;
State Key Laboratory of Digital Manufacturing Equipment and TechnologySchool of Mechanical Science;
State Key Laboratory of Digital Manufacturing Equipment and TechnologySchool of Mechanical Science;
State Key Laboratory of Digital Manufacturing Equipment and TechnologySchool of Mechanical Science;
State Key Laboratory of Digital Manufacturing Equipment and TechnologySchool of Mechanical Science;
State Key Laboratory of Digital Manufacturing Equipment and TechnologySchool of Mechanical Science;
Hilbert transform (HT); phase unwrapping; sampling analysis; single‐frame interferogram; structured surface measurement; white light interferometry (WLI); width of the fringes;
机译:白光干涉测量中结构表面的快速测量方法
机译:粗糙表面上的白光干涉测量法-由表面粗糙度引起的测量不确定度
机译:使用克劳尔图法和油膜干涉测量结构表面上的皮肤摩擦测量
机译:白光相移干涉测量和图像缝合微观结构的较大表面轮廓测量
机译:激光和白光散斑测量方法的研究(统计,相关,条纹,光学滤波,相关)。
机译:使用扫描白光干扰测量法进行表面官能化微机械微电子的步进高度测量
机译:使用白光干涉测量的光学表面可再现粗糙度测量的过程开发